Characterizing the geometry of InAs nanowires using mirror electron microscopy
(2012) In Nanotechnology 23(12).- Abstract
- Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2495020
- author
- Kennedy, S. M. ; Hjort, Martin LU ; Mandl, B. ; Mårsell, Erik LU ; Zakharov, Alexei LU ; Mikkelsen, Anders LU ; Paganin, D. M. and Jesson, D. E.
- organization
- publishing date
- 2012
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Nanotechnology
- volume
- 23
- issue
- 12
- article number
- 125703
- publisher
- IOP Publishing
- external identifiers
-
- wos:000301662400012
- scopus:84858425217
- pmid:22397834
- ISSN
- 0957-4484
- DOI
- 10.1088/0957-4484/23/12/125703
- language
- English
- LU publication?
- yes
- id
- 793a5a7c-1360-4d39-8004-9a33e4cc8d60 (old id 2495020)
- date added to LUP
- 2016-04-01 09:58:26
- date last changed
- 2023-11-09 08:53:22
@article{793a5a7c-1360-4d39-8004-9a33e4cc8d60, abstract = {{Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.}}, author = {{Kennedy, S. M. and Hjort, Martin and Mandl, B. and Mårsell, Erik and Zakharov, Alexei and Mikkelsen, Anders and Paganin, D. M. and Jesson, D. E.}}, issn = {{0957-4484}}, language = {{eng}}, number = {{12}}, publisher = {{IOP Publishing}}, series = {{Nanotechnology}}, title = {{Characterizing the geometry of InAs nanowires using mirror electron microscopy}}, url = {{http://dx.doi.org/10.1088/0957-4484/23/12/125703}}, doi = {{10.1088/0957-4484/23/12/125703}}, volume = {{23}}, year = {{2012}}, }