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Measurement of the sensitive profile in a solid state silicon detector, irradiated by X-rays

Thungstrom, G. ; Herrnsdorf, Lars LU ; Norlin, B. ; Reza, S. ; Krapohl, D. ; Mattsson, Sören LU and Gunnarsson, Mikael LU (2013) In Journal of Instrumentation 8.
Abstract
A newly constructed solid state silicon dose profile detector is characterized concerning its sensitive profile. The use of the MEDIPIX2 sensor system displays an excellent method to align an image of an X-ray slit to a sample under test. The scanning from front to reverse side of the detector, show a decrease in sensitivity of 20%, which indicates a minority charge carrier lifetime of 0.18 ms and a diffusion length of 460 mu m. The influence of diced edges results in a volumetric efficiency of 59%, an active volume of 1.2 mm(2) of total 2.1 mm(2).
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author
; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Solid state detectors, X-ray detectors, Dosimetry concepts and, apparatus, Computerized Tomography (CT) and Computed Radiography (CR)
in
Journal of Instrumentation
volume
8
article number
C04004
publisher
IOP Publishing
external identifiers
  • wos:000317462400004
  • scopus:84877780840
ISSN
1748-0221
DOI
10.1088/1748-0221/8/04/C04004
language
English
LU publication?
yes
id
7c644b6e-f04f-49e3-8a63-6aebbd74827d (old id 3854807)
date added to LUP
2016-04-01 13:50:03
date last changed
2022-01-27 21:21:40
@article{7c644b6e-f04f-49e3-8a63-6aebbd74827d,
  abstract     = {{A newly constructed solid state silicon dose profile detector is characterized concerning its sensitive profile. The use of the MEDIPIX2 sensor system displays an excellent method to align an image of an X-ray slit to a sample under test. The scanning from front to reverse side of the detector, show a decrease in sensitivity of 20%, which indicates a minority charge carrier lifetime of 0.18 ms and a diffusion length of 460 mu m. The influence of diced edges results in a volumetric efficiency of 59%, an active volume of 1.2 mm(2) of total 2.1 mm(2).}},
  author       = {{Thungstrom, G. and Herrnsdorf, Lars and Norlin, B. and Reza, S. and Krapohl, D. and Mattsson, Sören and Gunnarsson, Mikael}},
  issn         = {{1748-0221}},
  keywords     = {{Solid state detectors; X-ray detectors; Dosimetry concepts and; apparatus; Computerized Tomography (CT) and Computed Radiography (CR)}},
  language     = {{eng}},
  publisher    = {{IOP Publishing}},
  series       = {{Journal of Instrumentation}},
  title        = {{Measurement of the sensitive profile in a solid state silicon detector, irradiated by X-rays}},
  url          = {{http://dx.doi.org/10.1088/1748-0221/8/04/C04004}},
  doi          = {{10.1088/1748-0221/8/04/C04004}},
  volume       = {{8}},
  year         = {{2013}},
}