Measurement of the sensitive profile in a solid state silicon detector, irradiated by X-rays
(2013) In Journal of Instrumentation 8.- Abstract
- A newly constructed solid state silicon dose profile detector is characterized concerning its sensitive profile. The use of the MEDIPIX2 sensor system displays an excellent method to align an image of an X-ray slit to a sample under test. The scanning from front to reverse side of the detector, show a decrease in sensitivity of 20%, which indicates a minority charge carrier lifetime of 0.18 ms and a diffusion length of 460 mu m. The influence of diced edges results in a volumetric efficiency of 59%, an active volume of 1.2 mm(2) of total 2.1 mm(2).
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3854807
- author
- Thungstrom, G. ; Herrnsdorf, Lars LU ; Norlin, B. ; Reza, S. ; Krapohl, D. ; Mattsson, Sören LU and Gunnarsson, Mikael LU
- organization
- publishing date
- 2013
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- Solid state detectors, X-ray detectors, Dosimetry concepts and, apparatus, Computerized Tomography (CT) and Computed Radiography (CR)
- in
- Journal of Instrumentation
- volume
- 8
- article number
- C04004
- publisher
- IOP Publishing
- external identifiers
-
- wos:000317462400004
- scopus:84877780840
- ISSN
- 1748-0221
- DOI
- 10.1088/1748-0221/8/04/C04004
- language
- English
- LU publication?
- yes
- id
- 7c644b6e-f04f-49e3-8a63-6aebbd74827d (old id 3854807)
- date added to LUP
- 2016-04-01 13:50:03
- date last changed
- 2022-01-27 21:21:40
@article{7c644b6e-f04f-49e3-8a63-6aebbd74827d, abstract = {{A newly constructed solid state silicon dose profile detector is characterized concerning its sensitive profile. The use of the MEDIPIX2 sensor system displays an excellent method to align an image of an X-ray slit to a sample under test. The scanning from front to reverse side of the detector, show a decrease in sensitivity of 20%, which indicates a minority charge carrier lifetime of 0.18 ms and a diffusion length of 460 mu m. The influence of diced edges results in a volumetric efficiency of 59%, an active volume of 1.2 mm(2) of total 2.1 mm(2).}}, author = {{Thungstrom, G. and Herrnsdorf, Lars and Norlin, B. and Reza, S. and Krapohl, D. and Mattsson, Sören and Gunnarsson, Mikael}}, issn = {{1748-0221}}, keywords = {{Solid state detectors; X-ray detectors; Dosimetry concepts and; apparatus; Computerized Tomography (CT) and Computed Radiography (CR)}}, language = {{eng}}, publisher = {{IOP Publishing}}, series = {{Journal of Instrumentation}}, title = {{Measurement of the sensitive profile in a solid state silicon detector, irradiated by X-rays}}, url = {{http://dx.doi.org/10.1088/1748-0221/8/04/C04004}}, doi = {{10.1088/1748-0221/8/04/C04004}}, volume = {{8}}, year = {{2013}}, }