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Spectrally resolved x-ray beam induced current in a single InGaP nanowire

Chayanun, Lert LU ; Dagyte, Vilgaile LU ; Troian, Andrea LU ; Salomon, Damien; Borgström, Magnus LU and Wallentin, Jesper LU (2018) In Nanotechnology 29(45).
Abstract

We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n + -i-n + doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.

Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
nanowire, x-ray absorption fine structure spectroscopy (XAFS), x-ray beam induced current (XBIC)
in
Nanotechnology
volume
29
issue
45
publisher
IOP Publishing
external identifiers
  • scopus:85053410087
ISSN
0957-4484
DOI
10.1088/1361-6528/aadc76
language
English
LU publication?
yes
id
8449d963-6ae1-43cb-8220-eb24433d3b79
date added to LUP
2018-10-11 08:37:10
date last changed
2018-10-12 03:00:02
@article{8449d963-6ae1-43cb-8220-eb24433d3b79,
  abstract     = {<p>We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n <sup>+</sup> -i-n <sup>+</sup> doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.</p>},
  articleno    = {454001},
  author       = {Chayanun, Lert and Dagyte, Vilgaile and Troian, Andrea and Salomon, Damien and Borgström, Magnus and Wallentin, Jesper},
  issn         = {0957-4484},
  keyword      = {nanowire,x-ray absorption fine structure spectroscopy (XAFS),x-ray beam induced current (XBIC)},
  language     = {eng},
  month        = {09},
  number       = {45},
  publisher    = {IOP Publishing},
  series       = {Nanotechnology},
  title        = {Spectrally resolved x-ray beam induced current in a single InGaP nanowire},
  url          = {http://dx.doi.org/10.1088/1361-6528/aadc76},
  volume       = {29},
  year         = {2018},
}