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What do we know about defect detection methods

Runeson, Per LU ; Andersson, Carina LU ; Thelin, Thomas LU ; Andrews, A and Berling, Tomas LU (2006) In IEEE Software 23(3). p.82-82
Abstract
Using 12 empirical studies, including 10 experiments and two case studies, the author's compare. inspection and testing techniques and then derive practical implications. Although the research results were somewhat inconclusive, the authors recommend that practitioners generally use inspections for requirements and design and testing for code. Also, because different defect detection methods find different types of defects, the methods might be complementary. Finally, they list factors that help frame the question and guide practitioners in integrating and evaluating the detection methods in their environments.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
IEEE Software
volume
23
issue
3
pages
82 - 82
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
external identifiers
  • wos:000237356000016
  • scopus:33646516579
ISSN
0740-7459
DOI
10.1109/MS.2006.89
language
English
LU publication?
yes
id
8583ed29-b755-4c2e-88fe-38c47928c9cd (old id 410456)
date added to LUP
2007-08-16 11:52:38
date last changed
2018-05-29 10:22:40
@article{8583ed29-b755-4c2e-88fe-38c47928c9cd,
  abstract     = {Using 12 empirical studies, including 10 experiments and two case studies, the author's compare. inspection and testing techniques and then derive practical implications. Although the research results were somewhat inconclusive, the authors recommend that practitioners generally use inspections for requirements and design and testing for code. Also, because different defect detection methods find different types of defects, the methods might be complementary. Finally, they list factors that help frame the question and guide practitioners in integrating and evaluating the detection methods in their environments.},
  author       = {Runeson, Per and Andersson, Carina and Thelin, Thomas and Andrews, A and Berling, Tomas},
  issn         = {0740-7459},
  language     = {eng},
  number       = {3},
  pages        = {82--82},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  series       = {IEEE Software},
  title        = {What do we know about defect detection methods},
  url          = {http://dx.doi.org/10.1109/MS.2006.89},
  volume       = {23},
  year         = {2006},
}