Depth-Resolved X-Ray Photoelectron Spectroscopy Evidence of Intrinsic Polar States in HfO2-Based Ferroelectrics
(2024) In Advanced Materials 36(45).- Abstract
The discovery of ferroelectricity in nanoscale hafnia-based oxide films has spurred interest in understanding their emergent properties. Investigation focuses on the size-dependent polarization behavior, which is sensitive to content and movement of oxygen vacancies. Though polarization switching and electrochemical reactions is shown to co-occur, their relationship remains unclear. This study employs X-ray photoelectron spectroscopy with depth sensitivity to examine changes in electrochemical states occurring during polarization switching. Contrasting Hf0.5Zr0.5O2 (HZO) with Hf0.88La0.04Ta0.08O2 (HLTO), a composition with an equivalent structure and comparable... (More)
The discovery of ferroelectricity in nanoscale hafnia-based oxide films has spurred interest in understanding their emergent properties. Investigation focuses on the size-dependent polarization behavior, which is sensitive to content and movement of oxygen vacancies. Though polarization switching and electrochemical reactions is shown to co-occur, their relationship remains unclear. This study employs X-ray photoelectron spectroscopy with depth sensitivity to examine changes in electrochemical states occurring during polarization switching. Contrasting Hf0.5Zr0.5O2 (HZO) with Hf0.88La0.04Ta0.08O2 (HLTO), a composition with an equivalent structure and comparable average ionic radius, electrochemical states are directly observed for specific polarization directions. Lower-polarization films exhibit more significant electrochemical changes upon switching, suggesting an indirect relationship between polarization and electrochemical state. This research illuminates the complex interplay between polarization and electrochemical dynamics, providing evidence for intrinsic polar states in HfO2-based ferroelectrics.
(Less)
- author
- organization
- publishing date
- 2024-11-07
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- electrochemistry, ferroelectricity, hafnia, x-ray photoelectron spectroscopy
- in
- Advanced Materials
- volume
- 36
- issue
- 45
- article number
- 2408572
- publisher
- John Wiley & Sons Inc.
- external identifiers
-
- scopus:85203688242
- pmid:39263830
- ISSN
- 0935-9648
- DOI
- 10.1002/adma.202408572
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2024 The Author(s). Advanced Materials published by Wiley-VCH GmbH.
- id
- 869fd3be-5715-4a10-8f84-409983149d27
- date added to LUP
- 2024-12-09 14:33:14
- date last changed
- 2024-12-10 11:12:18
@article{869fd3be-5715-4a10-8f84-409983149d27,
abstract = {{<p>The discovery of ferroelectricity in nanoscale hafnia-based oxide films has spurred interest in understanding their emergent properties. Investigation focuses on the size-dependent polarization behavior, which is sensitive to content and movement of oxygen vacancies. Though polarization switching and electrochemical reactions is shown to co-occur, their relationship remains unclear. This study employs X-ray photoelectron spectroscopy with depth sensitivity to examine changes in electrochemical states occurring during polarization switching. Contrasting Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> (HZO) with Hf<sub>0.88</sub>La<sub>0.04</sub>Ta<sub>0.08</sub>O<sub>2</sub> (HLTO), a composition with an equivalent structure and comparable average ionic radius, electrochemical states are directly observed for specific polarization directions. Lower-polarization films exhibit more significant electrochemical changes upon switching, suggesting an indirect relationship between polarization and electrochemical state. This research illuminates the complex interplay between polarization and electrochemical dynamics, providing evidence for intrinsic polar states in HfO<sub>2</sub>-based ferroelectrics.</p>}},
author = {{Hill, Megan O. and Kim, Ji Soo and Müller, Moritz L. and Phuyal, Dibya and Taper, Sunil and Bansal, Manisha and Becker, Maximilian T. and Bakhit, Babak and Maity, Tuhin and Monserrat, Bartomeu and Martino, Giuliana Di and Strkalj, Nives and MacManus-Driscoll, Judith L.}},
issn = {{0935-9648}},
keywords = {{electrochemistry; ferroelectricity; hafnia; x-ray photoelectron spectroscopy}},
language = {{eng}},
month = {{11}},
number = {{45}},
publisher = {{John Wiley & Sons Inc.}},
series = {{Advanced Materials}},
title = {{Depth-Resolved X-Ray Photoelectron Spectroscopy Evidence of Intrinsic Polar States in HfO<sub>2</sub>-Based Ferroelectrics}},
url = {{http://dx.doi.org/10.1002/adma.202408572}},
doi = {{10.1002/adma.202408572}},
volume = {{36}},
year = {{2024}},
}