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In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device

Wallentin, Jesper LU ; Osterhoff, Markus and Salditt, Tim (2016) In Advanced Materials 28(9). p.1788-1792
Abstract

Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.

Please use this url to cite or link to this publication:
author
; and
publishing date
type
Contribution to journal
publication status
published
subject
keywords
lattice contraction, single nanowire devices, X-ray nanodiffraction
in
Advanced Materials
volume
28
issue
9
pages
5 pages
publisher
John Wiley & Sons Inc.
external identifiers
  • scopus:84959542517
ISSN
0935-9648
DOI
10.1002/adma.201504188
language
English
LU publication?
no
id
86e962bb-eba0-40a5-a093-d33098ba562f
date added to LUP
2017-12-13 16:23:34
date last changed
2022-02-07 17:32:47
@article{86e962bb-eba0-40a5-a093-d33098ba562f,
  abstract     = {{<p>Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.</p>}},
  author       = {{Wallentin, Jesper and Osterhoff, Markus and Salditt, Tim}},
  issn         = {{0935-9648}},
  keywords     = {{lattice contraction; single nanowire devices; X-ray nanodiffraction}},
  language     = {{eng}},
  month        = {{03}},
  number       = {{9}},
  pages        = {{1788--1792}},
  publisher    = {{John Wiley & Sons Inc.}},
  series       = {{Advanced Materials}},
  title        = {{In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device}},
  url          = {{http://dx.doi.org/10.1002/adma.201504188}},
  doi          = {{10.1002/adma.201504188}},
  volume       = {{28}},
  year         = {{2016}},
}