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In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device

Wallentin, Jesper LU ; Osterhoff, Markus and Salditt, Tim (2016) In Advanced Materials 28(9). p.1788-1792
Abstract

Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.

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author
publishing date
type
Contribution to journal
publication status
published
subject
keywords
lattice contraction, single nanowire devices, X-ray nanodiffraction
in
Advanced Materials
volume
28
issue
9
pages
5 pages
publisher
John Wiley & Sons
external identifiers
  • scopus:84959542517
ISSN
0935-9648
DOI
language
English
LU publication?
no
id
86e962bb-eba0-40a5-a093-d33098ba562f
date added to LUP
2017-12-13 16:23:34
date last changed
2018-05-29 10:40:22
@article{86e962bb-eba0-40a5-a093-d33098ba562f,
  abstract     = {<p>Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.</p>},
  author       = {Wallentin, Jesper and Osterhoff, Markus and Salditt, Tim},
  issn         = {0935-9648},
  keyword      = {lattice contraction,single nanowire devices,X-ray nanodiffraction},
  language     = {eng},
  month        = {03},
  number       = {9},
  pages        = {1788--1792},
  publisher    = {John Wiley & Sons},
  series       = {Advanced Materials},
  title        = {In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device},
  url          = {http://dx.doi.org/},
  volume       = {28},
  year         = {2016},
}