Focused and coherent X-ray beams for advanced microscopies
(2023) In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 539. p.127-135- Abstract
The use of focused X-ray beams in the micron and sub-micron range has fostered the progress of a wide range of scanning microscopy approaches that exploit the numerous interactions of X-rays with matter. These methods are becoming crucial for an increasing number of research fields, such as energy materials, electronic devices, biology, to cite a few. Nanobeams produced at 4th generation synchrotrons have coherence properties that make them ideal for a 3D diffraction-based microscopy with unique sensitivity to strain and defects in crystalline materials and allow delving into materials heterogeneities. We provide here a short overview on the use of nanobeams for diffraction experiments, and perspectives for their use in spectroscopy... (More)
The use of focused X-ray beams in the micron and sub-micron range has fostered the progress of a wide range of scanning microscopy approaches that exploit the numerous interactions of X-rays with matter. These methods are becoming crucial for an increasing number of research fields, such as energy materials, electronic devices, biology, to cite a few. Nanobeams produced at 4th generation synchrotrons have coherence properties that make them ideal for a 3D diffraction-based microscopy with unique sensitivity to strain and defects in crystalline materials and allow delving into materials heterogeneities. We provide here a short overview on the use of nanobeams for diffraction experiments, and perspectives for their use in spectroscopy studies.
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- author
- Carbone, Dina LU and Bikondoa, Oier
- organization
- publishing date
- 2023-06
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
- volume
- 539
- pages
- 9 pages
- publisher
- Elsevier
- external identifiers
-
- scopus:85151808234
- ISSN
- 0168-583X
- DOI
- 10.1016/j.nimb.2023.03.036
- language
- English
- LU publication?
- yes
- additional info
- Funding Information: DC acknowledges support from the Swedish Research council under contract 2018-07152 , the Swedish Governmental Agency for Innovation Systems under contract 2018-04969 , and Formas, Sweden under contract 2019-02496 . O.B. gratefully acknowledges the financial support of the UK Engineering and Physical Sciences Research Council (EPSRC) . Publisher Copyright: © 2023 The Author(s)
- id
- 87b4f2cd-cdd1-4347-a856-cf2141a9e71a
- date added to LUP
- 2024-01-12 15:16:21
- date last changed
- 2024-01-12 15:18:15
@article{87b4f2cd-cdd1-4347-a856-cf2141a9e71a,
abstract = {{<p>The use of focused X-ray beams in the micron and sub-micron range has fostered the progress of a wide range of scanning microscopy approaches that exploit the numerous interactions of X-rays with matter. These methods are becoming crucial for an increasing number of research fields, such as energy materials, electronic devices, biology, to cite a few. Nanobeams produced at 4th generation synchrotrons have coherence properties that make them ideal for a 3D diffraction-based microscopy with unique sensitivity to strain and defects in crystalline materials and allow delving into materials heterogeneities. We provide here a short overview on the use of nanobeams for diffraction experiments, and perspectives for their use in spectroscopy studies.</p>}},
author = {{Carbone, Dina and Bikondoa, Oier}},
issn = {{0168-583X}},
language = {{eng}},
pages = {{127--135}},
publisher = {{Elsevier}},
series = {{Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms}},
title = {{Focused and coherent X-ray beams for advanced microscopies}},
url = {{http://dx.doi.org/10.1016/j.nimb.2023.03.036}},
doi = {{10.1016/j.nimb.2023.03.036}},
volume = {{539}},
year = {{2023}},
}