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Bi-based superconducting multilayers obtained by molecular beam epitaxy

Salvato, M. ; Attanasio, C. ; Carbone, G. LU ; Di Luccio, T. ; Prischepa, S. L. ; Russo, R. and Maritato, L. (1999) In International Journal of Modern Physics B 13(9-10). p.991-996
Abstract

High temperature superconducting multilayers have been obtained depositing Bi2Sr2CuO6+δ (2201) and ACuO2 layers, where A is C a or Sr, by Molecular Beam Epitaxy (MBE) on M gO and SrTiO3 substrates. The samples, formed by a sequence of 2201/ACuO2 bilayers, have different thickness of ACuO2 layers while the thickness of the 2201 layers is kept constant. The surface structure of each layer has been monitored by in situ Reflection High Energy Electron... (More)

High temperature superconducting multilayers have been obtained depositing Bi2Sr2CuO6+δ (2201) and ACuO2 layers, where A is C a or Sr, by Molecular Beam Epitaxy (MBE) on M gO and SrTiO3 substrates. The samples, formed by a sequence of 2201/ACuO2 bilayers, have different thickness of ACuO2 layers while the thickness of the 2201 layers is kept constant. The surface structure of each layer has been monitored by in situ Reflection High Energy Electron Diffraction (RHEED) analysis which has confirmed a 2D nucleation growth. X-ray diffraction (XRD) analysis has been used to confirm that the layered structure has been obtained. Moreover, a one-dimensional X-ray kinematic diffraction model has been developed to interpret the experimental data and to estimate the period of the multilayers. Resistive measurements have shown that the electrical properties of the samples strongly depend on the thickness of the ACuO2 layers.

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publishing date
type
Contribution to journal
publication status
published
in
International Journal of Modern Physics B
volume
13
issue
9-10
pages
6 pages
publisher
World Scientific Publishing
external identifiers
  • scopus:27844603396
ISSN
0217-9792
DOI
10.1142/s0217979299000849
language
English
LU publication?
no
id
8f757d32-6428-4b17-8da8-dfc04767e692
date added to LUP
2021-12-15 12:07:59
date last changed
2022-02-02 02:08:45
@article{8f757d32-6428-4b17-8da8-dfc04767e692,
  abstract     = {{<p>High temperature superconducting multilayers have been obtained                         depositing                         Bi<sub>2</sub>Sr<sub>2</sub>CuO<sub>6+δ</sub>                         (2201) and ACuO<sub>2</sub> layers, where A is C a or Sr, by                         Molecular Beam Epitaxy (MBE) on M gO and SrTiO<sub>3</sub>                         substrates. The samples, formed by a sequence of                         2201/ACuO<sub>2</sub> bilayers, have different thickness of                         ACuO<sub>2</sub> layers while the thickness of the 2201 layers                         is kept constant. The surface structure of each layer has been monitored by                         in situ Reflection High Energy Electron Diffraction (RHEED) analysis which                         has confirmed a 2D nucleation growth. X-ray diffraction (XRD) analysis has                         been used to confirm that the layered structure has been obtained. Moreover,                         a one-dimensional X-ray kinematic diffraction model has been developed to                         interpret the experimental data and to estimate the period of the                         multilayers. Resistive measurements have shown that the electrical                         properties of the samples strongly depend on the thickness of the                         ACuO<sub>2</sub> layers.</p>}},
  author       = {{Salvato, M. and Attanasio, C. and Carbone, G. and Di Luccio, T. and Prischepa, S. L. and Russo, R. and Maritato, L.}},
  issn         = {{0217-9792}},
  language     = {{eng}},
  number       = {{9-10}},
  pages        = {{991--996}},
  publisher    = {{World Scientific Publishing}},
  series       = {{International Journal of Modern Physics B}},
  title        = {{Bi-based superconducting multilayers                      obtained by molecular beam epitaxy}},
  url          = {{http://dx.doi.org/10.1142/s0217979299000849}},
  doi          = {{10.1142/s0217979299000849}},
  volume       = {{13}},
  year         = {{1999}},
}