Statistical analysis of the UWB channel in an industrial environment
(2004) IEEE Vehicular Technology Conference (VTC2004-fall) p.81-85- Abstract
- In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger... (More)
- In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/614579
- author
- Kåredal, Johan LU ; Wyne, Shurjeel LU ; Almers, Peter LU ; Tufvesson, Fredrik LU and Molisch, Andreas LU
- organization
- publishing date
- 2004
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- metallic scatterers, industrial environment, dense multipath scattering, nonline-of-sight scenarios, 3.1 to 10.6 GHz, ray power decay constants, UWB channel, power delay profile, statistical analysis, Saleh-Valenzuela model, Rayleigh distributed small-scale fading signal, Nakagami distributions, factory hall
- host publication
- [Host publication title missing]
- pages
- 81 - 85
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- IEEE Vehicular Technology Conference (VTC2004-fall)
- conference location
- Los Angeles, CA, United States
- conference dates
- 2004-09-26 - 2004-09-29
- external identifiers
-
- wos:000227931900018
- scopus:17144402595
- ISBN
- 0-7803-8521-7
- DOI
- 10.1109/VETECF.2004.1399930
- language
- English
- LU publication?
- yes
- id
- 8fbf1d4d-7b13-48b9-9ff3-e2a0e1be39d8 (old id 614579)
- date added to LUP
- 2016-04-04 11:08:32
- date last changed
- 2022-04-24 00:14:06
@inproceedings{8fbf1d4d-7b13-48b9-9ff3-e2a0e1be39d8, abstract = {{In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy}}, author = {{Kåredal, Johan and Wyne, Shurjeel and Almers, Peter and Tufvesson, Fredrik and Molisch, Andreas}}, booktitle = {{[Host publication title missing]}}, isbn = {{0-7803-8521-7}}, keywords = {{metallic scatterers; industrial environment; dense multipath scattering; nonline-of-sight scenarios; 3.1 to 10.6 GHz; ray power decay constants; UWB channel; power delay profile; statistical analysis; Saleh-Valenzuela model; Rayleigh distributed small-scale fading signal; Nakagami distributions; factory hall}}, language = {{eng}}, pages = {{81--85}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Statistical analysis of the UWB channel in an industrial environment}}, url = {{https://lup.lub.lu.se/search/files/5703970/1291569.pdf}}, doi = {{10.1109/VETECF.2004.1399930}}, year = {{2004}}, }