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Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy

Ouattara, Lassana LU ; Mikkelsen, Anders LU ; Borgström, Magnus LU ; Samuelson, Lars LU ; Seifert, Werner LU and Lundgren, Edvin LU (2004) 8th International Conference on Nanometer-Scale Science and Technology, 2004 In Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004)
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Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004)
conference name
8th International Conference on Nanometer-Scale Science and Technology, 2004
language
English
LU publication?
yes
id
b0e9cfec-7b28-40db-ae01-18b11c57dfce (old id 962207)
date added to LUP
2008-01-28 17:59:04
date last changed
2016-07-06 17:30:24
@inproceedings{b0e9cfec-7b28-40db-ae01-18b11c57dfce,
  author       = {Ouattara, Lassana and Mikkelsen, Anders and Borgström, Magnus and Samuelson, Lars and Seifert, Werner and Lundgren, Edvin},
  booktitle    = {Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004)},
  language     = {eng},
  title        = {Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy},
  year         = {2004},
}