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Scanning tunneling microscope and luminescence nanocharacterization of semiconductor quantum dots

Johansson, Mikael LU ; Håkanson, Ulf LU ; Pistol, Mats-Erik LU and Samuelson, Lars LU (2004) Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited In Book of extended abstracts: Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
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Chapter in Book/Report/Conference proceeding
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published
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in
Book of extended abstracts: Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
conference name
Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
language
English
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yes
id
0e9361c1-9a1f-46d3-b792-50ad6f3f2736 (old id 962462)
date added to LUP
2008-01-28 17:34:07
date last changed
2016-04-16 12:02:53
@inproceedings{0e9361c1-9a1f-46d3-b792-50ad6f3f2736,
  author       = {Johansson, Mikael and Håkanson, Ulf and Pistol, Mats-Erik and Samuelson, Lars},
  booktitle    = {Book of extended abstracts: Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited},
  language     = {eng},
  title        = {Scanning tunneling microscope and luminescence nanocharacterization of semiconductor quantum dots},
  year         = {2004},
}