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Grazing incidence X-ry measurements of epitaxial nanowires

Eymery, J; Rieutord, F; Favre-Nicolin, V; Fröberg, Linus LU ; Mårtensson, Thomas LU and Samuelson, Lars LU (2006) Semiconductor Nanowires Symposium, 2006 In Book of abstracts: Semicond Nanowires Symp, Eindhoven, The Netherlands (2006)
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Chapter in Book/Report/Conference proceeding
publication status
published
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in
Book of abstracts: Semicond Nanowires Symp, Eindhoven, The Netherlands (2006)
conference name
Semiconductor Nanowires Symposium, 2006
language
English
LU publication?
yes
id
21b2e64e-5429-44a7-8434-1744363c0f1c (old id 963252)
date added to LUP
2008-01-28 17:04:57
date last changed
2016-07-14 13:18:56
@inproceedings{21b2e64e-5429-44a7-8434-1744363c0f1c,
  author       = {Eymery, J and Rieutord, F and Favre-Nicolin, V and Fröberg, Linus and Mårtensson, Thomas and Samuelson, Lars},
  booktitle    = {Book of abstracts: Semicond Nanowires Symp, Eindhoven, The Netherlands (2006)},
  language     = {eng},
  title        = {Grazing incidence X-ry measurements of epitaxial nanowires},
  year         = {2006},
}