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Grazing incidence X-ry measurements of epitaxial nanowires

Eymery, J ; Rieutord, F ; Favre-Nicolin, V ; Fröberg, Linus LU ; Mårtensson, Thomas LU and Samuelson, Lars LU (2006) Semiconductor Nanowires Symposium, 2006
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author
; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Book of abstracts: Semicond Nanowires Symp, Eindhoven, The Netherlands (2006)
conference name
Semiconductor Nanowires Symposium, 2006
conference location
Eindhoven, Netherlands
conference dates
2006-09-19 - 2006-09-19
language
English
LU publication?
yes
id
21b2e64e-5429-44a7-8434-1744363c0f1c (old id 963252)
date added to LUP
2016-04-04 14:36:01
date last changed
2018-11-21 21:21:14
@inproceedings{21b2e64e-5429-44a7-8434-1744363c0f1c,
  author       = {{Eymery, J and Rieutord, F and Favre-Nicolin, V and Fröberg, Linus and Mårtensson, Thomas and Samuelson, Lars}},
  booktitle    = {{Book of abstracts: Semicond Nanowires Symp, Eindhoven, The Netherlands (2006)}},
  language     = {{eng}},
  title        = {{Grazing incidence X-ry measurements of epitaxial nanowires}},
  year         = {{2006}},
}