EL2-Maps from Computer Based Image Analysis of Semi-Insulating GaAs Wafers
(1985) Symposium on Defect Recognition and Image Processing in III-V Compounds
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/8517879
- author
- Nielsen, Lars ; Samuelsson, Lars ; Omling, Pär LU and Silverberg, Per
- organization
- publishing date
- 1985
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- Symposium on Defect Recognition and Image Processing in III-V Compounds
- conference location
- Montpellier, France
- conference dates
- 1985-07-02 - 1985-07-04
- external identifiers
-
- scopus:0022282360
- language
- English
- LU publication?
- yes
- id
- 983cf9e8-7884-464c-b5c5-3a503436b2f0 (old id 8517879)
- date added to LUP
- 2016-04-04 13:58:58
- date last changed
- 2021-01-03 09:41:33
@misc{983cf9e8-7884-464c-b5c5-3a503436b2f0,
author = {{Nielsen, Lars and Samuelsson, Lars and Omling, Pär and Silverberg, Per}},
language = {{eng}},
title = {{EL2-Maps from Computer Based Image Analysis of Semi-Insulating GaAs Wafers}},
year = {{1985}},
}