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Characterization of non-vertically aligned semiconductor nanowires by THz emission measurements

Beleckaite, I.; Adomavicius, R.; Molis, G.; Siusys, A.; Reszka, A.; Wojciechowski, T.; Sadowski, J. LU and Krotkus, A. (2016) 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 In 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 2016-November.
Abstract

In this work terahertz (THz) pulse emission of the non-vertically aligned GaAs core-shell nanowires (NWs) is investigated. THz emission azimuthal dependencies of different NW samples have been measured. It is shown that these measurements together with theoretical calculations could be a very promising method to determine the effective index of refraction (n0) of the NW ensemble. The measurement of azimuthal dependencies are confirmed to be a much more sensitive way for measuring n0 than traditional THz TDS method.

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organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
volume
2016-November
publisher
IEEE Computer Society
conference name
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
external identifiers
  • scopus:85006100026
ISBN
9781467384858
DOI
10.1109/IRMMW-THz.2016.7758794
language
English
LU publication?
yes
id
a662bd24-5a25-4945-8196-9687f7f5f260
date added to LUP
2016-12-30 08:44:13
date last changed
2017-01-01 08:44:52
@inproceedings{a662bd24-5a25-4945-8196-9687f7f5f260,
  abstract     = {<p>In this work terahertz (THz) pulse emission of the non-vertically aligned GaAs core-shell nanowires (NWs) is investigated. THz emission azimuthal dependencies of different NW samples have been measured. It is shown that these measurements together with theoretical calculations could be a very promising method to determine the effective index of refraction (n<sub>0</sub>) of the NW ensemble. The measurement of azimuthal dependencies are confirmed to be a much more sensitive way for measuring n<sub>0</sub> than traditional THz TDS method.</p>},
  author       = {Beleckaite, I. and Adomavicius, R. and Molis, G. and Siusys, A. and Reszka, A. and Wojciechowski, T. and Sadowski, J. and Krotkus, A.},
  booktitle    = {41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016},
  isbn         = {9781467384858},
  language     = {eng},
  month        = {11},
  publisher    = {IEEE Computer Society},
  title        = {Characterization of non-vertically aligned semiconductor nanowires by THz emission measurements},
  url          = {http://dx.doi.org/10.1109/IRMMW-THz.2016.7758794},
  volume       = {2016-November},
  year         = {2016},
}