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Characterization of non-vertically aligned semiconductor nanowires by THz emission measurements

Beleckaite, I. ; Adomavicius, R. ; Molis, G. ; Siusys, A. ; Reszka, A. ; Wojciechowski, T. ; Sadowski, J. LU and Krotkus, A. (2016) 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 2016-November.
Abstract

In this work terahertz (THz) pulse emission of the non-vertically aligned GaAs core-shell nanowires (NWs) is investigated. THz emission azimuthal dependencies of different NW samples have been measured. It is shown that these measurements together with theoretical calculations could be a very promising method to determine the effective index of refraction (n0) of the NW ensemble. The measurement of azimuthal dependencies are confirmed to be a much more sensitive way for measuring n0 than traditional THz TDS method.

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author
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organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
volume
2016-November
article number
7758794
publisher
IEEE Computer Society
conference name
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
conference location
Copenhagen, Denmark
conference dates
2016-09-25 - 2016-09-30
external identifiers
  • scopus:85006100026
ISBN
9781467384858
DOI
10.1109/IRMMW-THz.2016.7758794
language
English
LU publication?
yes
id
a662bd24-5a25-4945-8196-9687f7f5f260
date added to LUP
2016-12-30 08:44:13
date last changed
2025-04-04 14:36:16
@inproceedings{a662bd24-5a25-4945-8196-9687f7f5f260,
  abstract     = {{<p>In this work terahertz (THz) pulse emission of the non-vertically aligned GaAs core-shell nanowires (NWs) is investigated. THz emission azimuthal dependencies of different NW samples have been measured. It is shown that these measurements together with theoretical calculations could be a very promising method to determine the effective index of refraction (n<sub>0</sub>) of the NW ensemble. The measurement of azimuthal dependencies are confirmed to be a much more sensitive way for measuring n<sub>0</sub> than traditional THz TDS method.</p>}},
  author       = {{Beleckaite, I. and Adomavicius, R. and Molis, G. and Siusys, A. and Reszka, A. and Wojciechowski, T. and Sadowski, J. and Krotkus, A.}},
  booktitle    = {{41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016}},
  isbn         = {{9781467384858}},
  language     = {{eng}},
  month        = {{11}},
  publisher    = {{IEEE Computer Society}},
  title        = {{Characterization of non-vertically aligned semiconductor nanowires by THz emission measurements}},
  url          = {{http://dx.doi.org/10.1109/IRMMW-THz.2016.7758794}},
  doi          = {{10.1109/IRMMW-THz.2016.7758794}},
  volume       = {{2016-November}},
  year         = {{2016}},
}