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Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imaging

Montelius, L. LU ; Tegenfeldt, Jonas LU orcid and van Heeren, P (1994) In Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 12(3). p.2222-2226
Abstract
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with the shape of the sample. In this study we report on a clear‐cut in situ direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample. The sample was an array of columns fabricated using aerosol deposition of metal particles and subsequent plasma etching. In this article we report on the so‐called inverse AFM mode in which the tip is actually used as the sample and vice versa. We will present results using ordinary AFM tips and ‘‘tapping‐mode’’ tips as well as high‐aspect‐ratio supertips (Nanoprobe). We propose how this method can, with a very high accuracy,... (More)
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with the shape of the sample. In this study we report on a clear‐cut in situ direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample. The sample was an array of columns fabricated using aerosol deposition of metal particles and subsequent plasma etching. In this article we report on the so‐called inverse AFM mode in which the tip is actually used as the sample and vice versa. We will present results using ordinary AFM tips and ‘‘tapping‐mode’’ tips as well as high‐aspect‐ratio supertips (Nanoprobe). We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are deliberately attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images. (Less)
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author
; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
volume
12
issue
3
pages
2222 - 2226
publisher
American Institute of Physics (AIP)
ISSN
0734-211X
DOI
10.1116/1.587746
language
English
LU publication?
yes
id
b4adbd53-b6bb-444c-8572-2b62573321ef
alternative location
http://scitation.aip.org/content/avs/journal/jvstb/12/3/10.1116/1.587746
date added to LUP
2019-04-28 14:23:19
date last changed
2019-06-03 16:50:44
@article{b4adbd53-b6bb-444c-8572-2b62573321ef,
  abstract     = {{It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with the shape of the sample. In this study we report on a clear‐cut in situ direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample. The sample was an array of columns fabricated using aerosol deposition of metal particles and subsequent plasma etching. In this article we report on the so‐called inverse AFM mode in which the tip is actually used as the sample and vice versa. We will present results using ordinary AFM tips and ‘‘tapping‐mode’’ tips as well as high‐aspect‐ratio supertips (Nanoprobe). We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are deliberately attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images.}},
  author       = {{Montelius, L. and Tegenfeldt, Jonas and van Heeren, P}},
  issn         = {{0734-211X}},
  language     = {{eng}},
  month        = {{05}},
  number       = {{3}},
  pages        = {{2222--2226}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures}},
  title        = {{Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imaging}},
  url          = {{http://dx.doi.org/10.1116/1.587746}},
  doi          = {{10.1116/1.587746}},
  volume       = {{12}},
  year         = {{1994}},
}