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- 1994
-
Mark
Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imaging
Montelius, L. LU ; Tegenfeldt, Jonas LU
and van Heeren, P
(1994)
In Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
12(3).
p.2222-2226
- Contribution to journal › Article