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Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface

Fernandez-Martin, Cristina ; Roser, Stephen J. and Edler, Karen J. LU orcid (2008) In Journal of Materials Chemistry 18(11). p.1222-1231
Abstract

Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes... (More)

Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.

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author
; and
publishing date
type
Contribution to journal
publication status
published
in
Journal of Materials Chemistry
volume
18
issue
11
pages
10 pages
publisher
Royal Society of Chemistry
external identifiers
  • scopus:40449137446
ISSN
0959-9428
DOI
10.1039/b716662a
language
English
LU publication?
no
id
bc8134f8-abf7-40f9-b17b-e4ab2e3b0f68
date added to LUP
2023-05-04 18:10:29
date last changed
2023-06-13 08:32:48
@article{bc8134f8-abf7-40f9-b17b-e4ab2e3b0f68,
  abstract     = {{<p>Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C<sub>16</sub>EO<sub>8</sub>) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C<sub>16</sub>EO<sub>8</sub> molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.</p>}},
  author       = {{Fernandez-Martin, Cristina and Roser, Stephen J. and Edler, Karen J.}},
  issn         = {{0959-9428}},
  language     = {{eng}},
  number       = {{11}},
  pages        = {{1222--1231}},
  publisher    = {{Royal Society of Chemistry}},
  series       = {{Journal of Materials Chemistry}},
  title        = {{Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface}},
  url          = {{http://dx.doi.org/10.1039/b716662a}},
  doi          = {{10.1039/b716662a}},
  volume       = {{18}},
  year         = {{2008}},
}