Use of astigmatic re-focusing at HP-XPS end-station
(2013) 11th International Conference on Synchrotron Radiation Instrumentation (SRI) 425.- Abstract
- In this paper we present the refocusing optics for the new high pressure photoelectron spectroscopy (HP-XPS) branch line at MAX-lab, based on a plane grating monochromator with vertically collimated beam. For the HP-XPS instrument, the required spot size is dictated by the small geometric acceptance of the HP-XPS electron energy analyzer. Whereas a pair of bendable mirrors in a KB configuration has some advantages as refocusing elements, we have studied whether similar performance can be achieved with a single non-bendable mirror. In this solution, however, the need for strong horizontal magnification results in a strong vertical magnification and into a very asymmetric image, the height being just a fraction of the width. We have studied... (More)
- In this paper we present the refocusing optics for the new high pressure photoelectron spectroscopy (HP-XPS) branch line at MAX-lab, based on a plane grating monochromator with vertically collimated beam. For the HP-XPS instrument, the required spot size is dictated by the small geometric acceptance of the HP-XPS electron energy analyzer. Whereas a pair of bendable mirrors in a KB configuration has some advantages as refocusing elements, we have studied whether similar performance can be achieved with a single non-bendable mirror. In this solution, however, the need for strong horizontal magnification results in a strong vertical magnification and into a very asymmetric image, the height being just a fraction of the width. We have studied through an analytical geometrical model and ray tracing simulations the use of astigmatism to increase the vertical beam size up to the geometric acceptance of the detector. As a result the vertical beam size at sample plane is mostly determined by the photon angular distribution and is not dependent on the exit slit aperture size. In addition the vertical beam size can be controlled by the grating c(ff) parameter, making possible to adjust the photon density and minimize sample damage by the radiation. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3979460
- author
- Grizolli, Walan LU ; Hennies, Franz LU ; Knudsen, Jan LU ; Nyholm, Ralf LU ; Sankari, Rami LU and Schnadt, Joachim LU
- organization
- publishing date
- 2013
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)
- volume
- 425
- article number
- 152005
- publisher
- IOP Publishing
- conference name
- 11th International Conference on Synchrotron Radiation Instrumentation (SRI)
- conference location
- Lyon, France
- conference dates
- 2012-07-09 - 2012-07-13
- external identifiers
-
- wos:000320403700205
- scopus:84876252426
- ISSN
- 1742-6588
- 1742-6596
- DOI
- 10.1088/1742-6596/425/15/152005
- language
- English
- LU publication?
- yes
- id
- bdd67637-c9c2-4c89-a877-f4264d762f50 (old id 3979460)
- date added to LUP
- 2016-04-01 10:34:47
- date last changed
- 2025-01-14 18:21:16
@inproceedings{bdd67637-c9c2-4c89-a877-f4264d762f50, abstract = {{In this paper we present the refocusing optics for the new high pressure photoelectron spectroscopy (HP-XPS) branch line at MAX-lab, based on a plane grating monochromator with vertically collimated beam. For the HP-XPS instrument, the required spot size is dictated by the small geometric acceptance of the HP-XPS electron energy analyzer. Whereas a pair of bendable mirrors in a KB configuration has some advantages as refocusing elements, we have studied whether similar performance can be achieved with a single non-bendable mirror. In this solution, however, the need for strong horizontal magnification results in a strong vertical magnification and into a very asymmetric image, the height being just a fraction of the width. We have studied through an analytical geometrical model and ray tracing simulations the use of astigmatism to increase the vertical beam size up to the geometric acceptance of the detector. As a result the vertical beam size at sample plane is mostly determined by the photon angular distribution and is not dependent on the exit slit aperture size. In addition the vertical beam size can be controlled by the grating c(ff) parameter, making possible to adjust the photon density and minimize sample damage by the radiation.}}, author = {{Grizolli, Walan and Hennies, Franz and Knudsen, Jan and Nyholm, Ralf and Sankari, Rami and Schnadt, Joachim}}, booktitle = {{11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)}}, issn = {{1742-6588}}, language = {{eng}}, publisher = {{IOP Publishing}}, title = {{Use of astigmatic re-focusing at HP-XPS end-station}}, url = {{http://dx.doi.org/10.1088/1742-6596/425/15/152005}}, doi = {{10.1088/1742-6596/425/15/152005}}, volume = {{425}}, year = {{2013}}, }