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Automating the setup and control of the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility

Frost, R. J.W. LU ; De La Rosa, N. LU ; Kristiansson, P. LU and Pallon, J. LU (2020) In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 464. p.84-88
Abstract

In many IBA applications the aim is to obtain quantitative figures characterising the sample, usually requiring a reliable measurement of the beam current for normalisation. To avoid the drawbacks associated with on-sample and post-sample charge measurement systems a pre-sample measurement system can be used. In this work an upgrade to the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility is presented, in which a custom built control module based around a Teensy 3.2 micro-controller has been added to the existing system. The new control module allows for remote handling and monitoring of the deflection system, operated via USB connection to a PC running a graphical user interface. Details of the control modules... (More)

In many IBA applications the aim is to obtain quantitative figures characterising the sample, usually requiring a reliable measurement of the beam current for normalisation. To avoid the drawbacks associated with on-sample and post-sample charge measurement systems a pre-sample measurement system can be used. In this work an upgrade to the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility is presented, in which a custom built control module based around a Teensy 3.2 micro-controller has been added to the existing system. The new control module allows for remote handling and monitoring of the deflection system, operated via USB connection to a PC running a graphical user interface. Details of the control modules functionality, design and programming are given, as well as the functionality of the user interface. An example of how the new control module can be used for automated calibration of the deflection system is also presented.

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author
; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Beam blanker, Charge measurement, Digital control, Ion-beam analysis, Micro-controller
in
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
volume
464
pages
5 pages
publisher
Elsevier
external identifiers
  • scopus:85076778406
ISSN
0168-583X
DOI
10.1016/j.nimb.2019.12.004
language
English
LU publication?
yes
id
c42b83be-2a42-43a8-8bd3-840e79168bd0
date added to LUP
2020-01-03 09:49:59
date last changed
2022-04-18 19:49:16
@article{c42b83be-2a42-43a8-8bd3-840e79168bd0,
  abstract     = {{<p>In many IBA applications the aim is to obtain quantitative figures characterising the sample, usually requiring a reliable measurement of the beam current for normalisation. To avoid the drawbacks associated with on-sample and post-sample charge measurement systems a pre-sample measurement system can be used. In this work an upgrade to the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility is presented, in which a custom built control module based around a Teensy 3.2 micro-controller has been added to the existing system. The new control module allows for remote handling and monitoring of the deflection system, operated via USB connection to a PC running a graphical user interface. Details of the control modules functionality, design and programming are given, as well as the functionality of the user interface. An example of how the new control module can be used for automated calibration of the deflection system is also presented.</p>}},
  author       = {{Frost, R. J.W. and De La Rosa, N. and Kristiansson, P. and Pallon, J.}},
  issn         = {{0168-583X}},
  keywords     = {{Beam blanker; Charge measurement; Digital control; Ion-beam analysis; Micro-controller}},
  language     = {{eng}},
  pages        = {{84--88}},
  publisher    = {{Elsevier}},
  series       = {{Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms}},
  title        = {{Automating the setup and control of the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility}},
  url          = {{http://dx.doi.org/10.1016/j.nimb.2019.12.004}},
  doi          = {{10.1016/j.nimb.2019.12.004}},
  volume       = {{464}},
  year         = {{2020}},
}