Advanced

Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687

Petersen, Kim; Nikolov, Dimitar LU ; Ingelsson, Urban; Carlsson, Gunnar; Ghani Zadegan, Farrokh LU and Larsson, Erik LU (2014) 20th IEEE International On-Line Testing Symposium
Abstract
As fault handling in multi-processor system-on-chips (MPSoCs) is a major challenge, we have developed an MPSoC demonstrator that enables experimentation on fault injection and fault handling. Our MPSoC demonstrator consists of (1) an MPSoC model with a set of components (devices) each equipped with fault detection features, so called instruments, (2) an Instrument Access Infrastructure (IAI) based on IEEE P1687 that connects the instruments, (3) a Fault Indication and Propagation Infrastructure (FIPI) that propagates fault indications to system-level, (4) a Resource Manager (RM) to schedule jobs based on fault statuses, (5) an Instrument Manager (IM) connecting the IAI and the RM, and (6) a Fault Injection Manager (FIM) that inserts... (More)
As fault handling in multi-processor system-on-chips (MPSoCs) is a major challenge, we have developed an MPSoC demonstrator that enables experimentation on fault injection and fault handling. Our MPSoC demonstrator consists of (1) an MPSoC model with a set of components (devices) each equipped with fault detection features, so called instruments, (2) an Instrument Access Infrastructure (IAI) based on IEEE P1687 that connects the instruments, (3) a Fault Indication and Propagation Infrastructure (FIPI) that propagates fault indications to system-level, (4) a Resource Manager (RM) to schedule jobs based on fault statuses, (5) an Instrument Manager (IM) connecting the IAI and the RM, and (6) a Fault Injection Manager (FIM) that inserts faults. The main goal of the demonstrator is to enable experimentation on different fault handling solutions. The novelty in this particular demonstrator is that it uses the existing test features, i.e. IEEE P1687 infrastructure, to assist fault handling. The demonstrator is implemented and a case study is performed. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
IEEE P1687, testing, fault management
host publication
2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
20th IEEE International On-Line Testing Symposium
conference location
Platja d'Aro, Catalunya, Spain
conference dates
2014-07-07
external identifiers
  • scopus:84906702020
ISBN
978-1-4799-5324-0
DOI
10.1109/IOLTS.2014.6873664
language
English
LU publication?
yes
id
cced2f5a-5985-4375-ba72-107064458d80 (old id 4446836)
date added to LUP
2014-05-26 14:11:45
date last changed
2019-04-07 04:28:46
@inproceedings{cced2f5a-5985-4375-ba72-107064458d80,
  abstract     = {As fault handling in multi-processor system-on-chips (MPSoCs) is a major challenge, we have developed an MPSoC demonstrator that enables experimentation on fault injection and fault handling. Our MPSoC demonstrator consists of (1) an MPSoC model with a set of components (devices) each equipped with fault detection features, so called instruments, (2) an Instrument Access Infrastructure (IAI) based on IEEE P1687 that connects the instruments, (3) a Fault Indication and Propagation Infrastructure (FIPI) that propagates fault indications to system-level, (4) a Resource Manager (RM) to schedule jobs based on fault statuses, (5) an Instrument Manager (IM) connecting the IAI and the RM, and (6) a Fault Injection Manager (FIM) that inserts faults. The main goal of the demonstrator is to enable experimentation on different fault handling solutions. The novelty in this particular demonstrator is that it uses the existing test features, i.e. IEEE P1687 infrastructure, to assist fault handling. The demonstrator is implemented and a case study is performed.},
  author       = {Petersen, Kim and Nikolov, Dimitar and Ingelsson, Urban and Carlsson, Gunnar and Ghani Zadegan, Farrokh and Larsson, Erik},
  isbn         = {978-1-4799-5324-0},
  keyword      = {IEEE P1687,testing,fault management},
  language     = {eng},
  location     = {Platja d'Aro, Catalunya, Spain},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687},
  url          = {http://dx.doi.org/10.1109/IOLTS.2014.6873664},
  year         = {2014},
}