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2014
Mark Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
Petersen, Kim ; Nikolov, Dimitar ^LU ; Ingelsson, Urban ; Carlsson, Gunnar ; Ghani Zadegan, Farrokh ^LU and Larsson, Erik ^LU (2014) 20th IEEE International On-Line Testing Symposium
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2013
Mark Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies
Larsson, Erik ^LU and Keim, Martin (2013) VLSI Test Symposium (VTS)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2012
Mark Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
Ghani Zadegan, Farrokh ^LU ; Ingelsson, Urban ; Carlsson, Gunnar and Larsson, Erik ^LU (2012) In IEEE Design & Test of Computers 29(2). p.79-88
- Contribution to journal › Article
Mark Re-using Chip Level DFT at Board Level
Gu, Xinli ; Rearick, Jeff ; Eklow, Bill ; Qian, Jun ; Jutman, Artur ; Chakrabarty, Krishnendu and Larsson, Erik ^LU (2012) European Test Symposium, 2012 p.205-205
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2011
Mark Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
Ghani Zadegan, Farrokh ^LU ; Ingelsson, Urban ; Asani, Golnaz ; Carlsson, Gunnar and Larsson, Erik ^LU (2011) Test Symposium (ATS), 2011 20th Asian p.525-531
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding