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Re-using Chip Level DFT at Board Level

Gu, Xinli ; Rearick, Jeff ; Eklow, Bill ; Qian, Jun ; Jutman, Artur ; Chakrabarty, Krishnendu and Larsson, Erik LU orcid (2012) European Test Symposium, 2012 p.205-205
Abstract
As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?
Please use this url to cite or link to this publication:
author
; ; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Board test, board diagnosis, chip access, IEEE P1687, IEEE 1149.1
host publication
[Host publication title missing]
pages
1 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
European Test Symposium, 2012
conference location
Annecy, France
conference dates
2012-05-28 - 2012-05-28
external identifiers
  • scopus:84864714878
language
English
LU publication?
yes
id
0058eb93-f749-4b1e-890c-7e32ca96a97f (old id 2732595)
date added to LUP
2016-04-04 12:02:04
date last changed
2025-10-14 12:57:44
@inproceedings{0058eb93-f749-4b1e-890c-7e32ca96a97f,
  abstract     = {{As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?}},
  author       = {{Gu, Xinli and Rearick, Jeff and Eklow, Bill and Qian, Jun and Jutman, Artur and Chakrabarty, Krishnendu and Larsson, Erik}},
  booktitle    = {{[Host publication title missing]}},
  keywords     = {{Board test; board diagnosis; chip access; IEEE P1687; IEEE 1149.1}},
  language     = {{eng}},
  pages        = {{205--205}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Re-using Chip Level DFT at Board Level}},
  url          = {{https://lup.lub.lu.se/search/files/5911952/2732605.pdf}},
  year         = {{2012}},
}