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- 2017
-
Mark
Test Planning for Core-based Integrated Circuits under Power Constraints
(
- Contribution to journal › Article
- 2013
-
Mark
Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies
2013) VLSI Test Symposium (VTS)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2012
-
Mark
Re-using Chip Level DFT at Board Level
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Accessing Embedded DfT Instruments with IEEE P1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding