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Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies

Larsson, Erik LU orcid and Keim, Martin (2013) VLSI Test Symposium (VTS)
Abstract
As semiconductor technologies enables highly advanced an complex integrated circuits (ICs), there is an increasing need to have more embedded design-for-test (DfT) instruments for test, debug, diagnosis, configuration, monitoring, etc. As these instruments are to be used not only at chip-level but also at board-level and system-level, a key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low- cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. We... (More)
As semiconductor technologies enables highly advanced an complex integrated circuits (ICs), there is an increasing need to have more embedded design-for-test (DfT) instruments for test, debug, diagnosis, configuration, monitoring, etc. As these instruments are to be used not only at chip-level but also at board-level and system-level, a key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low- cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. We will discuss the need of embedded instrumentation, the shortcomings of IEEE 1149.1, the features and challenges of IEEE P1687, as well as cases studies on the usage of IEEE P1687. (Less)
Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
embedded instruments, IJTAG, IEEE 1149.1, IEEE P1687
host publication
[Host publication title missing]
pages
2 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
VLSI Test Symposium (VTS)
conference location
Berkeley, CA, United States
conference dates
2013-04-29
external identifiers
  • wos:000326496900049
  • scopus:84881269759
ISSN
1093-0167
ISBN
978-1-4673-5542-1
DOI
10.1109/VTS.2013.6548930
language
English
LU publication?
yes
id
fe8c487f-3248-4855-b3b6-1f9e11529dae (old id 4145338)
date added to LUP
2016-04-01 13:46:46
date last changed
2022-01-27 21:04:58
@inproceedings{fe8c487f-3248-4855-b3b6-1f9e11529dae,
  abstract     = {{As semiconductor technologies enables highly advanced an complex integrated circuits (ICs), there is an increasing need to have more embedded design-for-test (DfT) instruments for test, debug, diagnosis, configuration, monitoring, etc. As these instruments are to be used not only at chip-level but also at board-level and system-level, a key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low- cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. We will discuss the need of embedded instrumentation, the shortcomings of IEEE 1149.1, the features and challenges of IEEE P1687, as well as cases studies on the usage of IEEE P1687.}},
  author       = {{Larsson, Erik and Keim, Martin}},
  booktitle    = {{[Host publication title missing]}},
  isbn         = {{978-1-4673-5542-1}},
  issn         = {{1093-0167}},
  keywords     = {{embedded instruments; IJTAG; IEEE 1149.1; IEEE P1687}},
  language     = {{eng}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies}},
  url          = {{https://lup.lub.lu.se/search/files/3583786/4145339.pdf}},
  doi          = {{10.1109/VTS.2013.6548930}},
  year         = {{2013}},
}