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- 2014
-
Mark
Test Planning and Test Access Mechanism Design for Stacked Chips using ILP
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2013
-
Mark
Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies
2013) VLSI Test Symposium (VTS)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2004
-
Mark
Defect-Aware SOC Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2003
-
Mark
Test Resource Partitioning and Optimization for SOC Designs
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding