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Interfacial profile of axial nanowire heterostructures in the nucleation limited regime

Leshchenko, E. D. LU and Johansson, J. LU orcid (2022) In CrystEngComm 24(46). p.8052-8059
Abstract

Heterostructured nanowires exhibit unique physical and electronic properties and are most commonly grown by the vapor-liquid-solid mechanism. Some of these properties are related to the interfacial abruptness of the heterointerface which makes its understanding and control particularly important for further development. In this regard, we present a model based on mass balance of atoms in the catalyst droplet where the atoms incorporate into the solid in the nucleation-limited regime. We explain how and why the decrease of growth temperature and increase of the flux of an element which forms a heterostructure leads to an improvement in the interface abruptness. Our model demonstrates that a sharp heterointerface can be obtained if one... (More)

Heterostructured nanowires exhibit unique physical and electronic properties and are most commonly grown by the vapor-liquid-solid mechanism. Some of these properties are related to the interfacial abruptness of the heterointerface which makes its understanding and control particularly important for further development. In this regard, we present a model based on mass balance of atoms in the catalyst droplet where the atoms incorporate into the solid in the nucleation-limited regime. We explain how and why the decrease of growth temperature and increase of the flux of an element which forms a heterostructure leads to an improvement in the interface abruptness. Our model demonstrates that a sharp heterointerface can be obtained if one uses a high concentration of the foreign catalyst rather than self-catalyzed growth, which can be explained by a reduced reservoir effect. For the examples of InAs/GaAs and GaAs/AlAs heterostructures, we compare the compositional profiles for the two different heterointerface directions.

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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
CrystEngComm
volume
24
issue
46
pages
8 pages
publisher
Royal Society of Chemistry
external identifiers
  • scopus:85141054879
ISSN
1466-8033
DOI
10.1039/d2ce01337a
language
English
LU publication?
yes
id
d51c535f-6975-4dd1-be51-7636fa178bd1
date added to LUP
2022-12-21 14:47:31
date last changed
2023-11-21 14:27:02
@article{d51c535f-6975-4dd1-be51-7636fa178bd1,
  abstract     = {{<p>Heterostructured nanowires exhibit unique physical and electronic properties and are most commonly grown by the vapor-liquid-solid mechanism. Some of these properties are related to the interfacial abruptness of the heterointerface which makes its understanding and control particularly important for further development. In this regard, we present a model based on mass balance of atoms in the catalyst droplet where the atoms incorporate into the solid in the nucleation-limited regime. We explain how and why the decrease of growth temperature and increase of the flux of an element which forms a heterostructure leads to an improvement in the interface abruptness. Our model demonstrates that a sharp heterointerface can be obtained if one uses a high concentration of the foreign catalyst rather than self-catalyzed growth, which can be explained by a reduced reservoir effect. For the examples of InAs/GaAs and GaAs/AlAs heterostructures, we compare the compositional profiles for the two different heterointerface directions.</p>}},
  author       = {{Leshchenko, E. D. and Johansson, J.}},
  issn         = {{1466-8033}},
  language     = {{eng}},
  number       = {{46}},
  pages        = {{8052--8059}},
  publisher    = {{Royal Society of Chemistry}},
  series       = {{CrystEngComm}},
  title        = {{Interfacial profile of axial nanowire heterostructures in the nucleation limited regime}},
  url          = {{http://dx.doi.org/10.1039/d2ce01337a}},
  doi          = {{10.1039/d2ce01337a}},
  volume       = {{24}},
  year         = {{2022}},
}