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Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Vagovič, Patrik ; Sato, Tokushi ; Mikeš, Ladislav ; Mills, Grant ; Graceffa, Rita ; Mattsson, Frans ; Villanueva-Perez, Pablo LU orcid ; Ershov, Alexey ; Faragó, Tomáš and Uličný, Jozef , et al. (2019) In Optica 6(9). p.1106-1109
Abstract

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per... (More)

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Optica
volume
6
issue
9
pages
4 pages
publisher
Optical Society of America
external identifiers
  • scopus:85073317998
ISSN
2334-2536
DOI
10.1364/OPTICA.6.001106
language
English
LU publication?
yes
id
d58ea7b0-9af5-436e-8c31-a520f21c575c
date added to LUP
2019-12-19 11:16:14
date last changed
2021-10-06 02:46:31
@article{d58ea7b0-9af5-436e-8c31-a520f21c575c,
  abstract     = {<p>Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.</p>},
  author       = {Vagovič, Patrik and Sato, Tokushi and Mikeš, Ladislav and Mills, Grant and Graceffa, Rita and Mattsson, Frans and Villanueva-Perez, Pablo and Ershov, Alexey and Faragó, Tomáš and Uličný, Jozef and Kirkwood, Henry and Letrun, Romain and Mokso, Rajmund and Zdora, Marie Christine and Olbinado, Margie P. and Rack, Alexander and Baumbach, Tilo and Schulz, Joachim and Meents, Alke and Chapman, Henry N. and Mancuso, Adrian P.},
  issn         = {2334-2536},
  language     = {eng},
  month        = {01},
  number       = {9},
  pages        = {1106--1109},
  publisher    = {Optical Society of America},
  series       = {Optica},
  title        = {Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources},
  url          = {http://dx.doi.org/10.1364/OPTICA.6.001106},
  doi          = {10.1364/OPTICA.6.001106},
  volume       = {6},
  year         = {2019},
}