Structural and electrical properties of superconducting Nb/Si multilayers
(1998) In Vacuum 50(1-2). p.31-33- Abstract
- We have found the deposition technology at which the interface roughness of Nb/Si multilayer is strongly correlated and decreases with deposited layer number. On the basis of our Nb/Si multilayer we succeeded to prepare ten-fold stacked Josephson junction (JJ). Basic electric properties of stacked JJ are presented.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/df6fa054-6224-4846-9762-b9e219abc604
- author
- Vavra, I ; Lobotka, P ; Derer, J and Wallenberg, LR LU
- organization
- publishing date
- 1998-05-01
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Vacuum
- volume
- 50
- issue
- 1-2
- pages
- 3 pages
- publisher
- Elsevier
- external identifiers
-
- scopus:0032058343
- ISSN
- 0042-207X
- DOI
- 10.1016/S0042-207X(98)00009-8
- language
- English
- LU publication?
- yes
- id
- df6fa054-6224-4846-9762-b9e219abc604
- date added to LUP
- 2023-10-31 16:05:20
- date last changed
- 2023-11-02 15:12:43
@article{df6fa054-6224-4846-9762-b9e219abc604, abstract = {{We have found the deposition technology at which the interface roughness of Nb/Si multilayer is strongly correlated and decreases with deposited layer number. On the basis of our Nb/Si multilayer we succeeded to prepare ten-fold stacked Josephson junction (JJ). Basic electric properties of stacked JJ are presented.}}, author = {{Vavra, I and Lobotka, P and Derer, J and Wallenberg, LR}}, issn = {{0042-207X}}, language = {{eng}}, month = {{05}}, number = {{1-2}}, pages = {{31--33}}, publisher = {{Elsevier}}, series = {{Vacuum}}, title = {{Structural and electrical properties of superconducting Nb/Si multilayers}}, url = {{http://dx.doi.org/10.1016/S0042-207X(98)00009-8}}, doi = {{10.1016/S0042-207X(98)00009-8}}, volume = {{50}}, year = {{1998}}, }