Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)
(2003) In Thin Solid Films 428. p.201-205
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/976208
- author
- Krasnikov, S. A. ; Preobrajenski, Alexei LU ; Chasse, T. and Szargan, R.
- organization
- publishing date
- 2003
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Thin Solid Films
- volume
- 428
- pages
- 201 - 205
- publisher
- Elsevier
- external identifiers
-
- scopus:0037457163
- ISSN
- 0040-6090
- language
- English
- LU publication?
- yes
- id
- e1c5484e-2188-43fa-92a8-c9a6e4aa95c4 (old id 976208)
- date added to LUP
- 2016-04-04 13:31:10
- date last changed
- 2025-10-14 11:40:18
@article{e1c5484e-2188-43fa-92a8-c9a6e4aa95c4,
author = {{Krasnikov, S. A. and Preobrajenski, Alexei and Chasse, T. and Szargan, R.}},
issn = {{0040-6090}},
language = {{eng}},
pages = {{201--205}},
publisher = {{Elsevier}},
series = {{Thin Solid Films}},
title = {{Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)}},
volume = {{428}},
year = {{2003}},
}