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Microwave Reconstruction of Fabrication Defects in Known Objects Using Scattering Parameter Sensitivities

Pallaris, Alexandros LU and Sjöberg, Daniel LU orcid (2025) 19th European Conference on Antennas and Propagation, EuCAP 2025 In EuCAP 2025 - 19th European Conference on Antennas and Propagation
Abstract

This paper investigates the detection of permittivity defects in a fabricated, known object, motivated by a desire to detect errors in additively manufactured objects that may affect their electromagnetic performance. We use scattering parameter sensitivities to reconstruct the relative permittivity of a generic 2D object from microwave scattering measurements and a known reference model. To find guidelines for the implementation of a future measurement system, this reconstruction was done using different parameters such as number of antennas used, frequencies, and bandwidth. The effect of bandwidth on the limits of the reconstruction's spatial resolution was investigated, showing a resolution of approximately one tenth of a wavelength,... (More)

This paper investigates the detection of permittivity defects in a fabricated, known object, motivated by a desire to detect errors in additively manufactured objects that may affect their electromagnetic performance. We use scattering parameter sensitivities to reconstruct the relative permittivity of a generic 2D object from microwave scattering measurements and a known reference model. To find guidelines for the implementation of a future measurement system, this reconstruction was done using different parameters such as number of antennas used, frequencies, and bandwidth. The effect of bandwidth on the limits of the reconstruction's spatial resolution was investigated, showing a resolution of approximately one tenth of a wavelength, which improves with increased bandwidth.

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Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
antennas, electromagnetics, finite element model, microwave, reconstruction, simulations
host publication
EuCAP 2025 - 19th European Conference on Antennas and Propagation
series title
EuCAP 2025 - 19th European Conference on Antennas and Propagation
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
19th European Conference on Antennas and Propagation, EuCAP 2025
conference location
Stockholm, Sweden
conference dates
2025-03-30 - 2025-04-04
external identifiers
  • scopus:105007512980
ISBN
9788831299107
DOI
10.23919/EuCAP63536.2025.10999660
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2025 European Association on Antennas and Propagation.
id
e695b4be-3ced-4987-9b1d-cada12e71f44
date added to LUP
2025-12-22 10:52:23
date last changed
2025-12-22 10:53:24
@inproceedings{e695b4be-3ced-4987-9b1d-cada12e71f44,
  abstract     = {{<p>This paper investigates the detection of permittivity defects in a fabricated, known object, motivated by a desire to detect errors in additively manufactured objects that may affect their electromagnetic performance. We use scattering parameter sensitivities to reconstruct the relative permittivity of a generic 2D object from microwave scattering measurements and a known reference model. To find guidelines for the implementation of a future measurement system, this reconstruction was done using different parameters such as number of antennas used, frequencies, and bandwidth. The effect of bandwidth on the limits of the reconstruction's spatial resolution was investigated, showing a resolution of approximately one tenth of a wavelength, which improves with increased bandwidth.</p>}},
  author       = {{Pallaris, Alexandros and Sjöberg, Daniel}},
  booktitle    = {{EuCAP 2025 - 19th European Conference on Antennas and Propagation}},
  isbn         = {{9788831299107}},
  keywords     = {{antennas; electromagnetics; finite element model; microwave; reconstruction; simulations}},
  language     = {{eng}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  series       = {{EuCAP 2025 - 19th European Conference on Antennas and Propagation}},
  title        = {{Microwave Reconstruction of Fabrication Defects in Known Objects Using Scattering Parameter Sensitivities}},
  url          = {{http://dx.doi.org/10.23919/EuCAP63536.2025.10999660}},
  doi          = {{10.23919/EuCAP63536.2025.10999660}},
  year         = {{2025}},
}