Near-Field Measurement and Calibration Technique for RF EMF Exposure Assessment of mm-wave 5G Devices
(2019)- Abstract
- Accurate and efficient measurement techniques are needed for exposure assessment of 5G portable devices---which are expected to utilize frequencies beyond 6 GHz---with respect to the radio frequency electromagnetic field exposure limits. Above 6 GHz, these limits are expressed in terms of the incident power density, thus requiring that the electromagnetic fields need to be evaluated with high precision in close vicinity to the device under test (DUT), i.e., in the near-field region of the radiating antenna. This work presents a cutting-edge near-field measurement technique suited for these needs. The technique---based on source reconstruction on a predefined surface representing the radiating aperture of the antenna---requires two sets of... (More)
- Accurate and efficient measurement techniques are needed for exposure assessment of 5G portable devices---which are expected to utilize frequencies beyond 6 GHz---with respect to the radio frequency electromagnetic field exposure limits. Above 6 GHz, these limits are expressed in terms of the incident power density, thus requiring that the electromagnetic fields need to be evaluated with high precision in close vicinity to the device under test (DUT), i.e., in the near-field region of the radiating antenna. This work presents a cutting-edge near-field measurement technique suited for these needs. The technique---based on source reconstruction on a predefined surface representing the radiating aperture of the antenna---requires two sets of measurements; one of the DUT, and one of a small aperture. This second measurement functions as a calibration of both the measurement probe impact on the received signal, and the experimental setup in terms of the relative distance between the probe and the DUT. Results are presented for a 28 GHz and a 60 GHz antenna array; both developed for 5G applications. The computed power density agrees well with simulations at evaluation planes residing as close as one fifth of a wavelength away from the DUT. (Less)
Please use this url to cite or link to this publication:
http://lup.lub.lu.se/record/ebf5f121-d29a-4334-8c56-7f33593bdf20
- author
- Lundgren, Johan LU ; Helander, Jakob LU ; Gustafsson, Mats LU ; Sjöberg, Daniel LU ; Xu, Bo LU and Colombi, Davide
- organization
- publishing date
- 2019
- type
- Book/Report
- publication status
- published
- subject
- pages
- 27 pages
- publisher
- Electromagnetic Theory Department of Electrical and Information Technology Lund University Sweden
- language
- English
- LU publication?
- yes
- id
- ebf5f121-d29a-4334-8c56-7f33593bdf20
- date added to LUP
- 2019-08-23 18:16:32
- date last changed
- 2019-08-26 11:36:23
@techreport{ebf5f121-d29a-4334-8c56-7f33593bdf20,
abstract = {Accurate and efficient measurement techniques are needed for exposure assessment of 5G portable devices---which are expected to utilize frequencies beyond 6 GHz---with respect to the radio frequency electromagnetic field exposure limits. Above 6 GHz, these limits are expressed in terms of the incident power density, thus requiring that the electromagnetic fields need to be evaluated with high precision in close vicinity to the device under test (DUT), i.e., in the near-field region of the radiating antenna. This work presents a cutting-edge near-field measurement technique suited for these needs. The technique---based on source reconstruction on a predefined surface representing the radiating aperture of the antenna---requires two sets of measurements; one of the DUT, and one of a small aperture. This second measurement functions as a calibration of both the measurement probe impact on the received signal, and the experimental setup in terms of the relative distance between the probe and the DUT. Results are presented for a 28 GHz and a 60 GHz antenna array; both developed for 5G applications. The computed power density agrees well with simulations at evaluation planes residing as close as one fifth of a wavelength away from the DUT.},
author = {Lundgren, Johan and Helander, Jakob and Gustafsson, Mats and Sjöberg, Daniel and Xu, Bo and Colombi, Davide},
institution = {Electromagnetic Theory Department of Electrical and Information Technology Lund University Sweden},
language = {eng},
pages = {27},
title = {Near-Field Measurement and Calibration Technique for RF EMF Exposure Assessment of mm-wave 5G Devices},
year = {2019},
}