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Machine Learning Regression Analyses of Intensity Modulation Two-Photon Microscopy (ml-IM2PM) in Perovskite Microcrystals

Shi, Qi LU and Pullerits, Tönu LU (2024) In ACS Photonics 11(3). p.1093-1102
Abstract

Perovskite thin films hold great promise for optoelectronic applications, such as solar cells and light-emitting diodes. One challenge is the inevitable formation of defects in the material. A thorough understanding of the defect formation and its dynamics has proven difficult based on traditional spectroscopy. Here, we have integrated functional intensity modulation two-photon spectroscopy with artificial intelligence-enhanced data analysis to gain a deep understanding of defect-related trap states in perovskite microcrystals. We present a novel model of carrier recombination dynamics that comprehensively includes exciton and electron-hole pair photoluminescence (PL) emissions as well as trapping and detrapping equilibrium dynamics. By... (More)

Perovskite thin films hold great promise for optoelectronic applications, such as solar cells and light-emitting diodes. One challenge is the inevitable formation of defects in the material. A thorough understanding of the defect formation and its dynamics has proven difficult based on traditional spectroscopy. Here, we have integrated functional intensity modulation two-photon spectroscopy with artificial intelligence-enhanced data analysis to gain a deep understanding of defect-related trap states in perovskite microcrystals. We present a novel model of carrier recombination dynamics that comprehensively includes exciton and electron-hole pair photoluminescence (PL) emissions as well as trapping and detrapping equilibrium dynamics. By variation of the parameters in the dynamics model, a large pool of temperature-dependent intensity modulation PL spectra can be simulated by solving the ordinary differential equations in the carrier dynamics model. Then, the tree-based supervised machine learning methods and ensemble technique, regression chain, were used to optimize the machine learning regression analyses of intensity modulation two-photon microscopy (ml-IM2PM), which helps to determine the parameters of the charge carrier dynamics model based on the temperature-dependent intensity-modulated PL spectra in perovskite. And the reliability of the ml-IM2PM-predicted trap property parameters is confirmed by directly comparing the ml-IM2PM obtained intensity modulation spectra with experimental data. Furthermore, our approach not only reveals valuable insights into PL emissions, including those of excitons and free electron-hole pairs, but also provides details of trapping, detrapping, and nonradiative depopulation processes, providing a comprehensive understanding of the photophysics of perovskite materials. This study suggests that ml-IM2PM applications are promising for the study of various photoactive devices.

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author
and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
extra tree, intensity modulation technique, intensity modulation two-photon microscopy, machine learning, MAPbBr perovskite, regression chain
in
ACS Photonics
volume
11
issue
3
pages
10 pages
publisher
The American Chemical Society (ACS)
external identifiers
  • scopus:85187573580
ISSN
2330-4022
DOI
10.1021/acsphotonics.3c01523
language
English
LU publication?
yes
id
ec019f77-68c1-4567-9a35-85a104d6d7b5
date added to LUP
2024-04-02 12:08:14
date last changed
2024-04-03 11:47:20
@article{ec019f77-68c1-4567-9a35-85a104d6d7b5,
  abstract     = {{<p>Perovskite thin films hold great promise for optoelectronic applications, such as solar cells and light-emitting diodes. One challenge is the inevitable formation of defects in the material. A thorough understanding of the defect formation and its dynamics has proven difficult based on traditional spectroscopy. Here, we have integrated functional intensity modulation two-photon spectroscopy with artificial intelligence-enhanced data analysis to gain a deep understanding of defect-related trap states in perovskite microcrystals. We present a novel model of carrier recombination dynamics that comprehensively includes exciton and electron-hole pair photoluminescence (PL) emissions as well as trapping and detrapping equilibrium dynamics. By variation of the parameters in the dynamics model, a large pool of temperature-dependent intensity modulation PL spectra can be simulated by solving the ordinary differential equations in the carrier dynamics model. Then, the tree-based supervised machine learning methods and ensemble technique, regression chain, were used to optimize the machine learning regression analyses of intensity modulation two-photon microscopy (ml-IM2PM), which helps to determine the parameters of the charge carrier dynamics model based on the temperature-dependent intensity-modulated PL spectra in perovskite. And the reliability of the ml-IM2PM-predicted trap property parameters is confirmed by directly comparing the ml-IM2PM obtained intensity modulation spectra with experimental data. Furthermore, our approach not only reveals valuable insights into PL emissions, including those of excitons and free electron-hole pairs, but also provides details of trapping, detrapping, and nonradiative depopulation processes, providing a comprehensive understanding of the photophysics of perovskite materials. This study suggests that ml-IM2PM applications are promising for the study of various photoactive devices.</p>}},
  author       = {{Shi, Qi and Pullerits, Tönu}},
  issn         = {{2330-4022}},
  keywords     = {{extra tree; intensity modulation technique; intensity modulation two-photon microscopy; machine learning; MAPbBr perovskite; regression chain}},
  language     = {{eng}},
  number       = {{3}},
  pages        = {{1093--1102}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{ACS Photonics}},
  title        = {{Machine Learning Regression Analyses of Intensity Modulation Two-Photon Microscopy (ml-IM2PM) in Perovskite Microcrystals}},
  url          = {{http://dx.doi.org/10.1021/acsphotonics.3c01523}},
  doi          = {{10.1021/acsphotonics.3c01523}},
  volume       = {{11}},
  year         = {{2024}},
}