Dose-efficient scanning Compton X-ray microscopy
(2023) In Light: Science and Applications 12(1).- Abstract
The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement... (More)
The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement scheme for hard X rays, and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample, as confirmed by imaging a silicon wedge. Based on these results, we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.
(Less)
- author
- Li, Tang
; Dresselhaus, J. Lukas
; Ivanov, Nikolay
; Prasciolu, Mauro
; Fleckenstein, Holger
; Yefanov, Oleksandr
; Zhang, Wenhui
; Pennicard, David
; Dippel, Ann Christin
; Gutowski, Olof
; Villanueva-Perez, Pablo
LU
; Chapman, Henry N.
and Bajt, Saša
(Less) - organization
- publishing date
- 2023
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Light: Science and Applications
- volume
- 12
- issue
- 1
- article number
- 130
- publisher
- Nature Publishing Group
- external identifiers
-
- pmid:37248250
- scopus:85160727920
- ISSN
- 2095-5545
- DOI
- 10.1038/s41377-023-01176-5
- language
- English
- LU publication?
- yes
- id
- f5322a22-4c65-477f-bd3e-e5c6a5d17792
- date added to LUP
- 2023-08-15 15:35:01
- date last changed
- 2024-04-20 00:43:01
@article{f5322a22-4c65-477f-bd3e-e5c6a5d17792,
abstract = {{<p>The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement scheme for hard X rays, and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample, as confirmed by imaging a silicon wedge. Based on these results, we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.</p>}},
author = {{Li, Tang and Dresselhaus, J. Lukas and Ivanov, Nikolay and Prasciolu, Mauro and Fleckenstein, Holger and Yefanov, Oleksandr and Zhang, Wenhui and Pennicard, David and Dippel, Ann Christin and Gutowski, Olof and Villanueva-Perez, Pablo and Chapman, Henry N. and Bajt, Saša}},
issn = {{2095-5545}},
language = {{eng}},
number = {{1}},
publisher = {{Nature Publishing Group}},
series = {{Light: Science and Applications}},
title = {{Dose-efficient scanning Compton X-ray microscopy}},
url = {{http://dx.doi.org/10.1038/s41377-023-01176-5}},
doi = {{10.1038/s41377-023-01176-5}},
volume = {{12}},
year = {{2023}},
}