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60 GHz imaging of panels for defect detection using planar scanning

Helander, Jakob LU ; Ericsson, Andreas LU ; Sjöberg, Daniel LU orcid ; Gustafsson, Mats LU orcid ; Martin, Torleif LU and Larsson, Christer LU (2016) IEEE International Symposium on Antennas and Propagation, 2016 p.1025-1026
Abstract
This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.
Please use this url to cite or link to this publication:
author
; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
60 GHz, imaging, near-field techniques
host publication
2016 IEEE International Symposium on Antennas and Propagation (APSURSI), AP-S 2016
article number
7696220
pages
2 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE International Symposium on Antennas and Propagation, 2016
conference location
Fajardo, Puerto Rico, United States
conference dates
2016-06-26 - 2016-07-01
external identifiers
  • scopus:84997281830
ISBN
9781509028863
DOI
10.1109/APS.2016.7696220
language
English
LU publication?
yes
id
f6ab4c5e-89a1-4cd9-a0ea-87ed7de30e6f
date added to LUP
2016-12-12 13:05:56
date last changed
2022-01-30 08:27:21
@inproceedings{f6ab4c5e-89a1-4cd9-a0ea-87ed7de30e6f,
  abstract     = {{This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.}},
  author       = {{Helander, Jakob and Ericsson, Andreas and Sjöberg, Daniel and Gustafsson, Mats and Martin, Torleif and Larsson, Christer}},
  booktitle    = {{2016 IEEE International Symposium on Antennas and Propagation (APSURSI), AP-S 2016}},
  isbn         = {{9781509028863}},
  keywords     = {{60 GHz; imaging; near-field techniques}},
  language     = {{eng}},
  month        = {{10}},
  pages        = {{1025--1026}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{60 GHz imaging of panels for defect detection using planar scanning}},
  url          = {{http://dx.doi.org/10.1109/APS.2016.7696220}},
  doi          = {{10.1109/APS.2016.7696220}},
  year         = {{2016}},
}