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- 2018
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Mark
Conical etched ion tracks in SiO2 characterised by small angle X-ray scattering
(2018) In Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 435. p.133-136
- Contribution to journal › Article
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Mark
Nanoscale density variations induced by high energy heavy ions in amorphous silicon nitride and silicon dioxide
- Contribution to journal › Article