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- 2001
-
Mark
Test Scheduling and Scan-Chain Division Under Power Constraint
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
The Design and Optimization of SOC Test Solutions
Larsson, Erik LU
; Peng, Zebo
and Carlsson, Gunnar
(2001)
IEEE/ACM International Conference on Computer Aided Design, ICCAD 2001
p.523-530
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
System-on-Chip Test Parallelization Under Power Constraints
Larsson, Erik LU
and Peng, Zebo
(2001)
- Other contribution › Miscellaneous
-
Mark
An Integrated System-On-Chip Test Framework
Larsson, Erik LU
and Peng, Zebo
(2001)
Design, Automation and Test in Europe DATE Conference
p.138-144
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2000
-
Mark
An Integrated System-Level Design for Testability Methodology An Integrated System-Level Design for Testability Methodology
Larsson, Erik LU
(2000)
- Thesis › Doctoral thesis (monograph)
-
Mark
Test Infrastructure Design and Test Scheduling Optimization
Larsson, Erik LU
and Peng, Zebo
(2000)
- Other contribution › Miscellaneous
-
Mark
A Technique for Test Infrastructure Design and Test Scheduling
Larsson, Erik LU
and Peng, Zebo
(2000)
Design and Diagnostic of Electronic Circuits and Systems Workshop DDECS
p.26-26
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
System-on-Chip Test Bus Design and Test Scheduling
- Contribution to conference › Paper, not in proceeding