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- 2010
-
Mark
Test Time Analysis for IEEE P1687
Ghani Zadegan, Farrokh LU ; Ingelsson, Urban ; Carlsson, Gunnar and Larsson, Erik LU
(2010)
19th IEEE Asian Test Symposium (ATS10)
p.455-460
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
On-line Techniques to Adjust and Optimize Checkpointing Frequency
Nikolov, Dimitar LU ; Ingelsson, Urban ; Singh, Virendra and Larsson, Erik LU
(2010)
IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2010)
p.29-33
- Contribution to conference › Paper, not in proceeding
-
Mark
Mapping and Scheduling of Jobs in Homogeneous NoC-based MPSoC
Nikolov, Dimitar LU ; Karlsson, Erik ; Ingelsson, Urban ; Singh, Virendra and Larsson, Erik LU
(2010)
Swedish SoC Conference 2010
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Scheduling of Modular System-on-Chip under Capture Power Constraint
Tudu, Jaynarayan T. ; Larsson, Erik LU
and Singh, Virendra
(2010)
IEEE Eleventh Workshop on RTL and High Level Testing, 2010
- Contribution to conference › Paper, not in proceeding
-
Mark
Checking Pipelined Distributed and Global Properties at Post-silicon Debug
Larsson, Erik LU
; Vermeulen, Bart
and Goossens, Kees
(2010)
DAC Workshop on Diagnostic Services in Network-on-Chips (DSNoC'10)
- Contribution to conference › Paper, not in proceeding
-
Mark
Efficient Embedding of Deterministic Test Data
Majeed, Mudassar ; Ahlström, Daniel ; Ingelsson, Urban ; Carlsson, Gunnar and Larsson, Erik LU
(2010)
19th IEEE Asian Test Symposium (ATS10)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Energy-Efficient Fault Tolerance in Chip Multiprocessors Using Critical Value Forwarding
Subramanyan, Pramod ; Singh, Virendra ; Saluja, Kewal K. and Larsson, Erik LU
(2010)
The 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'10)Chicago, Illinois, USA, June 28-July 1, 2010.
p.121-130
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors
Subramanyan, Pramod ; Singh, Virendra ; Saluja, Kewal K. and Larsson, Erik LU
(2010)
Design Automation and Test in Europe (DATE)
p.1572-1577
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
Vinay, N.S. ; Rawat, Indira ; Gaur, M.S. ; Larsson, Erik LU
and Singh, Virendra
(2010)
IEEE East-West Design and Test Symposium (EWDTS10)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graph Theoretic Approach for Scan Cell Reordering to Minimize Peak Shift Power
Tudu, Jaynarayan T. ; Larsson, Erik LU
; Singh, Virendra
and Fujiwara, Hideo
(2010)
Great Lakes Symposium on VLSI (GLSVLSI'10), 2010
p.73-78
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding