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- 2010
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Mark
Efficient Embedding of Deterministic Test Data
2010) Swedish SoC Conference 2010(
- Contribution to conference › Paper, not in proceeding
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Mark
Checking Pipelined Distributed Global Properties for Post-silicon Debug
2010) IEEE Eleventh Workshop on RTL and High Level Testing, 2010(
- Contribution to conference › Paper, not in proceeding
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Mark
Scan Cells Reordering to Minimize Peak Power During Test Cycle : A Graph Theoretic Approach
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Test scheduling on IJTAG
2010) Nordic Test Forum (NTF 2010),(
- Contribution to conference › Paper, not in proceeding
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Mark
On-line Techniques to Adjust and Optimize Checkpointing Frequency
2010) IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2010) p.29-33(
- Contribution to conference › Paper, not in proceeding
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Mark
Mapping and Scheduling of Jobs in Homogeneous NoC-based MPSoC
2010) Swedish SoC Conference 2010(
- Contribution to conference › Paper, not in proceeding
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Mark
Test Time Analysis for IEEE P1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Efficient Embedding of Deterministic Test Data
2010) 19th IEEE Asian Test Symposium (ATS10)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Energy-Efficient Fault Tolerance in Chip Multiprocessors Using Critical Value Forwarding
2010) The 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'10)Chicago, Illinois, USA, June 28-July 1, 2010. p.121-130(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding