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- 2010
-
Mark
Bias-controlled friction of InAs nanowires on a silicon nitride layer studied by atomic force microscopy
(
- Contribution to journal › Article
-
Mark
Probing Strain in Bent Semiconductor Nanowires with Raman Spectroscopy.
(
- Contribution to journal › Article
-
Mark
Comparative friction measurements of InAs nanowires on three substrates
(
- Contribution to journal › Article
- 2009
-
Mark
Friction Measurements of InAs Nanowires on Silicon Nitride by AFM Manipulation
(
- Contribution to journal › Article
- 2008
-
Mark
AFM-based manipulation of InAs nanowires
2008) 17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology 100. p.052051-052051(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2007
-
Mark
Shear stress measurements on InAs nanowires by AFM manipulation
(
- Contribution to journal › Article