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- 2000
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Mark
Evaluation of intermittent contact mode AFM probes by HREM and using atomically sharp CeO2 ridges as tip characterizer
(
- Contribution to journal › Article
- 1999
-
Mark
Carbon monoxide oxidation on copper oxide thin films supported on corrugated cerium dioxide {111} and {001} surfaces
(
- Contribution to journal › Article
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Mark
Sharp microfaceting of (001)-oriented cerium dioxide thin films and the effect of annealing on surface morphology
(
- Contribution to journal › Article
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