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Sharp microfaceting of (001)-oriented cerium dioxide thin films and the effect of annealing on surface morphology

Jacobsen, SN ; Helmersson, U ; Erlandsson, R ; Skårman, B LU and Wallenberg, LR LU (1999) In Surface Science 429(1-3). p.22-33
Abstract
Cerium dioxide, CeO2, is a chemically stable oxygen-ion-conducting material, which has been extensively used as an additive or support in oxidation catalysts. The fact that catalytic behaviour is often surface structure sensitive and/or edge atom dependent suggests that different surfaces might be discernible in associated redox processes. Thus, it is desirable to realise CeO2 films with a well-defined microstructure and with crystallographically uniform surfaces. In this paper we present evidence of extremely sharp microfaceting on the surface of thin CeO2 films grown by r.f. magnetron sputtering, and the effect of annealing on the formed sharp ridges. The results show that nominally designated crystallographic surfaces may in fact not... (More)
Cerium dioxide, CeO2, is a chemically stable oxygen-ion-conducting material, which has been extensively used as an additive or support in oxidation catalysts. The fact that catalytic behaviour is often surface structure sensitive and/or edge atom dependent suggests that different surfaces might be discernible in associated redox processes. Thus, it is desirable to realise CeO2 films with a well-defined microstructure and with crystallographically uniform surfaces. In this paper we present evidence of extremely sharp microfaceting on the surface of thin CeO2 films grown by r.f. magnetron sputtering, and the effect of annealing on the formed sharp ridges. The results show that nominally designated crystallographic surfaces may in fact not coincide with the surfaces exposed as-grown. Thus, there is a clear risk for erroneous interpretation of various orientation-dependent surface properties. Carefully controlled annealing of these films can be utilised as a method for tailoring the resulting surface morphology on the atomic scale. (Less)
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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
atomic force microscopy (AFM), cerium dioxide, faceting, polycrystalline surfaces, scanning electron microscopy (SEM), surface structure morphology roughness and topography, transmission electron microscopy (TEM)
in
Surface Science
volume
429
issue
1-3
pages
12 pages
publisher
Elsevier
external identifiers
  • scopus:0032651537
ISSN
0039-6028
DOI
10.1016/S0039-6028(99)00320-9
language
English
LU publication?
yes
id
96532458-3cff-4bd2-be0d-0072550cec69
date added to LUP
2023-10-31 16:17:11
date last changed
2023-11-02 13:54:47
@article{96532458-3cff-4bd2-be0d-0072550cec69,
  abstract     = {{Cerium dioxide, CeO2, is a chemically stable oxygen-ion-conducting material, which has been extensively used as an additive or support in oxidation catalysts. The fact that catalytic behaviour is often surface structure sensitive and/or edge atom dependent suggests that different surfaces might be discernible in associated redox processes. Thus, it is desirable to realise CeO2 films with a well-defined microstructure and with crystallographically uniform surfaces. In this paper we present evidence of extremely sharp microfaceting on the surface of thin CeO2 films grown by r.f. magnetron sputtering, and the effect of annealing on the formed sharp ridges. The results show that nominally designated crystallographic surfaces may in fact not coincide with the surfaces exposed as-grown. Thus, there is a clear risk for erroneous interpretation of various orientation-dependent surface properties. Carefully controlled annealing of these films can be utilised as a method for tailoring the resulting surface morphology on the atomic scale.}},
  author       = {{Jacobsen, SN and Helmersson, U and Erlandsson, R and Skårman, B and Wallenberg, LR}},
  issn         = {{0039-6028}},
  keywords     = {{atomic force microscopy (AFM); cerium dioxide; faceting; polycrystalline surfaces; scanning electron microscopy (SEM); surface structure morphology roughness and topography; transmission electron microscopy (TEM)}},
  language     = {{eng}},
  month        = {{06}},
  number       = {{1-3}},
  pages        = {{22--33}},
  publisher    = {{Elsevier}},
  series       = {{Surface Science}},
  title        = {{Sharp microfaceting of (001)-oriented cerium dioxide thin films and the effect of annealing on surface morphology}},
  url          = {{http://dx.doi.org/10.1016/S0039-6028(99)00320-9}},
  doi          = {{10.1016/S0039-6028(99)00320-9}},
  volume       = {{429}},
  year         = {{1999}},
}