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- 2022
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Mark
Graceful degradation to prolong lifetime of semiconductors
2022) Knowledge for Sustainable Development(
– Lund University Research Conference- Contribution to conference › Poster
- 2021
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Mark
Access to on-chip test structures via functional buses
2021) Nordic Test Forum(
- Contribution to conference › Other
- 2017
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Mark
Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing
(
- Contribution to journal › Article
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
-
Mark
Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
- 2016
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Mark
In-Field System-Health Monitoring Based on IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Maximizing Level of Confidence for Non-Equidistant Checkpointing
2016) 21st Asia and South Pacific Design Automation Conference ASP-DAC(
- Contribution to conference › Paper, not in proceeding
-
Mark
Towards a Suite of IEEE 1687 Benchmark Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Retargeting Challenges in IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding