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2005
Mark Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters
Lundwall, M ; Tchaplyguine, Maxim ^LU ; Ohrwall, G ; Lindblad, A ; Peredkov, Sergey ^LU ; Rander, T ; Svensson, S and Bjorneholm, O (2005) In Surface Science 594(1-3). p.12-19
- Contribution to journal › Article
2002
Mark Quantative photoelectron spectromicroscopy for investigation of PMMA resist residues
Zakharov, Alexei ^LU ; Maximov, Ivan ^LU ; Holmqvist, T. ; Montelius, Lars ^LU and Lindau, Ingolf ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Structure, Morphology, and Catalytic Properties of CuO_x/CeO₂ Model Catalysts
Skårman, Björn ^LU (2002)
- Thesis › Doctoral thesis (compilation)

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