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- 2014
-
Mark
Test Planning and Test Access Mechanism Design for Stacked Chips using ILP
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2012
-
Mark
Test Planning for Core-based 3D Stacked ICs under Power Constraints
(2012) IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2012)
- Contribution to conference › Paper, not in proceeding
- 2011
-
Mark
Test Cost Modeling for 3D Stacked Chips with Through-Silicon Vias
(2011) Swedish System-on-Chip Conference, SSoCC 2011
- Contribution to conference › Paper, not in proceeding
