1 – 2 of 2
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=""
width=""
height=""
allowtransparency="true"
frameborder="0">
</iframe>
- 2004
-
Mark
Defect-Aware SOC Test Scheduling
Larsson, Erik LU
; Pouget, Julien
and Peng, Zebo
(2004)
2004 IEEE VLSI Test Symposium VTS04
p.359-364
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2003
-
Mark
Defect Probability-based System-On-Chip Test Scheduling
Larsson, Erik LU
; Pouget, Julien
and Peng, Zebo
(2003)
6th IEEE International Workshop on Design and Diagnostics of Electronics Circuits and Systems DDECS 03,2003
p.25-32
- Contribution to conference › Paper, not in proceeding