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- 2004
-
Mark
Defect-Aware SOC Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2003
-
Mark
Defect Probability-based System-On-Chip Test Scheduling
2003) 6th IEEE International Workshop on Design and Diagnostics of Electronics Circuits and Systems DDECS 03,2003 p.25-32(
- Contribution to conference › Paper, not in proceeding