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- 2003
-
Mark
System-on-Chip Test Scheduling based on Defect Probability
2003)(
- Other contribution › Miscellaneous
-
Mark
Defect Probability-based System-On-Chip Test Scheduling
2003) 6th IEEE International Workshop on Design and Diagnostics of Electronics Circuits and Systems DDECS 03,2003 p.25-32(
- Contribution to conference › Paper, not in proceeding
- 2002
-
Mark
A direct digital RF amplitude modulator
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Integrated Framework for the Design and Optimization of SOC Test Solutions
2002) p.21-36(
- Chapter in Book/Report/Conference proceeding › Book chapter
- 2001
-
Mark
The Design and Optimization of SOC Test Solutions
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Integrated System-On-Chip Test Framework
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2000
-
Mark
An Integrated System-Level Design for Testability Methodology An Integrated System-Level Design for Testability Methodology
2000)(
- Thesis › Doctoral thesis (monograph)
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