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- 2010
-
Mark
Probing Strain in Bent Semiconductor Nanowires with Raman Spectroscopy.
(
- Contribution to journal › Article
-
Mark
Bias-controlled friction of InAs nanowires on a silicon nitride layer studied by atomic force microscopy
(
- Contribution to journal › Article
-
Mark
Comparative friction measurements of InAs nanowires on three substrates
(
- Contribution to journal › Article
-
Mark
Studies of Nanowire Friction using AFM-based Manipulation
2010)(
- Thesis › Doctoral thesis (compilation)
- 2009
-
Mark
Friction Measurements of InAs Nanowires on Silicon Nitride by AFM Manipulation
(
- Contribution to journal › Article