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- 2009
-
Mark
On Scan Chain Diagnosis for Intermittent Faults
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Deterministic Scan-Chain Diagnosis for Intermittent Faults
2009) European Test Symposium, ETS 2009(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2007
-
Mark
Improved Scan Chain Diagnosis
2007) 15th NXP IC Test Symposium(
- Contribution to conference › Paper, not in proceeding