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- 2000
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Mark
Evaluation of intermittent contact mode AFM probes by HREM and using atomically sharp CeO2 ridges as tip characterizer
(
- Contribution to journal › Article
- 1998
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Mark
High rate reactive dc magnetron sputter deposition of Al2O3 films
(
- Contribution to journal › Article
-
Mark
Modeling of the deposition of stoichiometric Al2O3 using non-arcing dc magnetron sputtering
(
- Contribution to journal › Article
- 1997
-
Mark
High rate direct current reactive sputter deposition of Al2O3 - Required process parameters
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 1992
-
Mark
Microstructure and microwave loss studies on epitaxial YBa2Cu3Ox thin films
1992) p.219-224(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Yttrium oxide inclusions in YBa2Cu3Ox thin films : Enhanced flux pinning and relation to copper oxide surface particles
(
- Contribution to journal › Article