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- 2007
-
Mark
Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2006
-
Mark
High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
2006) 14th Philips Research IC Test Seminar(
- Contribution to conference › Paper, not in proceeding